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20 Threads found on Wgl Format
Can anybody tell me how to generate wgl format for test machine ?
Here is the wgl format documentation. Thnaks, Moez
In the design, there are some logic to test PHY, so I use simulation to generate VCD file to generate stimulus and get results for tester. But test house want to get wgl format. I have Encounter Test tool to generate FULLSCAN test pattern file (wgl format), how to translate VCD file to wgl file ???
please tell me how to generate wgl format file with Tetramax and exclude some pads I neednot .such as : vss ,vdd pad ............and so on .
Can't you write a simple python or perl script to do that for you? ( Anyhow I do not know what is wgl format at all but I think this should be a solution. )
After ATPG , DFT tools will generate some format pattern , and we generate wgl format pattern , before we just use the testbench generat by ATPG tools , now we heard someone use wgl or some other format pattern to run , and i want to know which tools can do this or how to deal with it . Thanks.
STIL format : IEEE 1450 - Standard Test Interface Language (STIL) wgl format : Edaboard discussion - wgl TDL :
MegaTool developed by Hanchi-tech covered all EDA pattern conversion. 1 - MegaVector It is a tool which converts VCD(Value Change Dump) and EVCD (Extended Value Change Dump) file generated by EDA tool into wgl format. 2 - MegaWaver It is a tool which converts wgl(Waveform Generation Language) and STIL(Standard Test Interface (...)
VCD file will be converted to wgl format by tools (ex:Mentor DFT tool), the DFT tool takes wgl file and does a pattern classification which can verify functionality after manufaturing of ASIC. The tool checks whether this same functional vectors can be used for stuck at fault detectiona and does necessary pattern generation and (...)
Shailesh: Which format to output from ATPG depends upon your target tester, and the translation software available to convert it to the ATE's native format. wgl is fairly popular, because it's the older of the formats. STIL is newer, and also very much accepted (most all ATPG tools will output both wgl (...)
TDL generation is generate the Test vectors or Test Patterns to validate the test logic. There are different formats to generate the patterns i.e TDL format(Texas Instrruments), wgl format(general). Tetramax and Fastscan can generate the TDL format patterns. This is answer for u r question.
I need some experienced hints as to how generate wgl formatted vectors from VCD vectors (that latter was generated from a functional NC-Sim simulation) ? Notes: 1. I have acces to both Synopsys 'TetraMax' and Mentor DFTAdvisor (+FastScan), but have no practical experience with neither tool. 2. I try 'set patterns external' (in TetraMax CMD com
Hi Rohit, What u have to do is; 1) first you save the internal patterns in .wgl format (I think u r looking for this format). This you have to do during the pattern generation time. Command: cmd1) set patterns internal cmd2) run atpg cmd3) write patterns (...)
Hi, Our testing engineer told me he can not convert the wgl due to the MUXClock mode in my at-speed ATPG patterns. I checked UserGuide and it seems by creating "_fast_WFT_" waveform format and then using it in capture_CLK procedure can fix it. But I always get syntax errors, such as "miscounted items". Anyone has the experience on it? Thanks
Dear All, I have a question on delay path fault test pattern generation. As we know, to test the delay path fault we need two test vector, v1 and v2. V1 is to initialize the circuit, and V2 applies to the circuit to generate a transition on the path under testing. Given a path under testing, is there a way I can get v1 and v2? This is what I
Pattern writing with common chain inputs not supported for selected format. (M385) Severity: Error Description TetraMAX generates this message when a design is using Shared ScanIn. The scan_in pin name is shared among scan groups. ScanStructures { ScanChain c1 { ScanIn "si1"; ScanOut "so1"; } ScanChain c2 { ScanIn "si1"; ScanOut "so2";
Hi , Q1. The test coverage is ready even before we write the patterns. So the format of the patterns has nothing to do with the coverage. The ATPG tool will have a pattern format internal to its memory which is actually giving you the test coverage. Now, at the end of the ATPG we give the command to write out these patterns. There are dif
TetraMAX uses Verilog library to build fault models. Try this: read_netlist /usr/local/synopsys/syn_vE-2010.12-SP4/doc/syn/dft_tutorial/LIB/class.v From Netlist formats, Testbenches, and Test Patterns Interfaces TetraMAX ATPG supports popular industry standards for netlist and test pattern formats: &#
You could made some Verilog code to read the wgl for example. It is strange that tetramax could not generate any Verilog test bench.
I have the following code for path delay test generation: read_netlist s27_synthsized_scan_test.v read_netlist ../../Library/saed90nm.v -library run_build_model s27 set_delay -nopi_changes set_delay -nopo_measures set_delay -mask_nontarget_paths set_delay -common_launch_capture_clock set_delay -relative_edge add_clocks 0 CK add_pi_con