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In "ESD in silicon integrated circuits", A.Amerasekera & C. Duvvury (p.12 - ) there is a solution for LCR curcuit ( ) : i = Vc*Cc*pow(w0,2)/sqrt(pow(a,2)-pow(w0,2))*exp(-a*t)*sinh(sqrt(pow(a,2)-pow(w0,2))*t) with a = R/(2*L1) and w0 = 1/sqrt(L1*Cs) and a>w0. So, this expression give st
It is mainly safety issue. The safety testing bodies will simulate the effect that will cause human electric shock after some components burned out.
Surface integral equation modeling approach to the handset antenna and human body interaction article