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163 Threads found on Scan Clock
Hello guys, I am thankfull to be part of this forum. I'm working with a design including just one clock ( benchmark ITC 99 design). My objectif is to reproduce one of the straggered clock scheme (attached) that I found in this paper (Using Launch-on-Capture for Testing scan Designs Containing Synchronous and Asynchrono
hi all, please tell why tool add extra lockup latch in scan flop,without a need,means there is no clock domain crossing between two scan cell..
Gated clocks are instead by Power compiler to replace "EN" input of FF's by gating their clock. During scan insertion stage, scan_shift signal is connected to "TE" port of the gate clocks, to allow toggling clock of the scan FF's during shift mode. My question is how to (...)
hi all, my asic failed in scan test in both DC and AC mode. the teat pattern failed from pattern NO 2. and some patterns failed at all their cycles. my STA and post simulation is all passed. i'v tried increase voltage, slow down clock frequence, but no there isn't any improvement. can any body tell me what is the
Why should we avoid gated clocks while inserting scan chains in our design? Is it a must that clock should be a primary input?
Hi all, I finished placement and when I ran preCTS timing analysis I got some violations in the path where scan clock is employed. That is my data delay is unwantedly 15ns, so that i couldn't meet the timimg for these kind of paths, and every other pathgroups met good timing. Do I miss some optimization comma
Hi. I am wondering How can I formality check what inserted scan and clock gating at netlist? As I know, there are TE so many. How do I set all TE?
Hi I'm trying to implement with design compiler. I just wondering about affect on hvt, rvt to scan or clock insertion. What is the best method which used library when scan and clock insertion? I usually used as follows. library read only rvt target library set with rvt compile with scan
Hi. I'm trying to implement to scan and clock gating insertion. But if I use insertion correctly, I need to know the minimum_bitwidth. But I wondering How I know the minimum_bitwidth?
Hi. I just had a question about the cross clock domain capture issue in DFT. As we know, we can insert a lockup latch on the scan chain who is crossing the clock domain, to ease the hold timing fix. But how to hanle the capture path which is asynchronous from clock domain A to clock domain B ? (...)
Hi, I am using Fastscan to run atpg simulation for transition delay fault. As we know that the LOS test coverage should be greater than LOC test coverage. But what I got from the atpg simulation results is that they have nearly same test coverage. I looked into the user guide and someone's dofile scripts from the web, and the only different part
Hello, When we say DFT ? it all comes when I use synthesis (it is understood that I have to decide dft architecture, scan compression, scan chain no), and give it to synthesis scripts and dft compiler will insert scan in netlist. But if I take a look at rtl level ? Not IP level, what should I consider? Please correct me and share (...)
Setup failures: Slow scan clock down. Hold failures: Increase temperature, decrease voltage. Then complain to the design team.
In my design, there are two independent clocks in functional mode and cross clock path are defined as false path. But in DC scan mode, these two clocks will be grouped into a single scan clock. Do we need to fix timing violation on these cross clock paths which become driven (...)
I have small sequential circuit with two primary inputs(line1,line2). I want to generate test vectors for critical path. So I used DFT compiler to insert and stich scan chain and Primetime to get critical path. spf and synthesized verilog ouput files from DFT compiler and timing report from PT is used in TetraMax to generate following STIL file.
etlibgenerator tool provided by tessent LV does not support LV scan model generation of clock gating cells. How to handle clock gating cells in LV flow? How to provide definition of clock gating cells in ETChecker step of LV flow?
Hello All, I have a design who has a single test pin e.g. gpio1. if gpio1 = 0 thn functional and if gpio1 =1 thn test mode. Now my design have a MBIST and scan mode. I want to seperate both modes. like When MBIST is enabled, scan must be disabled. if scan is enabled thn MBIST must be disabled. I do not have any extra pins, So how (...)
If your STA signoff is promising, maybe the error is caused by the asynchronous path if there are multiple scan clock. The other reason maybe the relationship between active edge of clock and probe point for measurement. It's better to check your simulated waveform for more details. If possible, I hope that you can share your result. Thanks.
in the scan mode, the scan clock is TST_CLK, so forgot the CLK pin. all your design will be balance for the worst case with TST_CLK.
High Fanout Nets: Some nets other than clock nets is called HFN. Ex: Reset, scan Enable etc. During synthesis, We set set_max_fanout to some number. i.e. we are telling the synthesis tool to that more than the max_fanout number treat it as High fanout net , so the tool knows and buffers the nets.