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163 Threads found on edaboard.com: Scan Clock
Hello guys, I am thankfull to be part of this forum. I'm working with a design including just one clock ( benchmark ITC 99 design). My objectif is to reproduce one of the straggered clock scheme (attached) that I found in this paper (Using Launch-on-Capture for Testing scan Designs Containing Synchronous and Asynchrono
hi all, please tell why tool add extra lockup latch in scan flop,without a need,means there is no clock domain crossing between two scan cell..
Gated clocks are instead by Power compiler to replace "EN" input of FF's by gating their clock. During scan insertion stage, scan_shift signal is connected to "TE" port of the gate clocks, to allow toggling clock of the scan FF's during shift mode. My question is how to (...)
hi all, my asic failed in scan test in both DC and AC mode. the teat pattern failed from pattern NO 2. and some patterns failed at all their cycles. my STA and post simulation is all passed. i'v tried increase voltage, slow down clock frequence, but no there isn't any improvement. can any body tell me what is the
Why should we avoid gated clocks while inserting scan chains in our design? Is it a must that clock should be a primary input?
Hi all, I finished placement and when I ran preCTS timing analysis I got some violations in the path where scan clock is employed. That is my data delay is unwantedly 15ns, so that i couldn't meet the timimg for these kind of paths, and every other pathgroups met good timing. Do I miss some optimization comma
Hello, are you interested for logic equivalence check/formality of scan inserted design? can you please clarify your question?
Hi I'm trying to implement with design compiler. I just wondering about affect on hvt, rvt to scan or clock insertion. What is the best method which used library when scan and clock insertion? I usually used as follows. 1.target library read only rvt 2.read target library set with rvt compile with scan
Hi. I'm trying to implement to scan and clock gating insertion. But if I use insertion correctly, I need to know the minimum_bitwidth. But I wondering How I know the minimum_bitwidth?
Hi. I just had a question about the cross clock domain capture issue in DFT. As we know, we can insert a lockup latch on the scan chain who is crossing the clock domain, to ease the hold timing fix. But how to hanle the capture path which is asynchronous from clock domain A to clock domain B ? (...)
Who knows? trace the source of the common procedure file and inquire from Fastscan. In LOC test patterns, scan enable signal does not need to operate at system speed. Once scan data is loaded through scan chains, scan enable signal transitions to 0. Subsequently, launch and capture clock (...)
When writing RTL, you need to consider what style of code will result in high test coverage. For example, an internal async reset make reduce coverage, unless you bypass it during scan mode. Likewise, if you are adding clock gating by hand in to the RTL, you will want to make sure the RTL enables the clock gater during scan (...)
Setup failures: Slow scan clock down. Hold failures: Increase temperature, decrease voltage. Then complain to the design team.
In my design, there are two independent clocks in functional mode and cross clock path are defined as false path. But in DC scan mode, these two clocks will be grouped into a single scan clock. Do we need to fix timing violation on these cross clock paths which become driven (...)
Hello, First of all, If you want to cover critical path, you have to use Path Delay testing. Critical path are not covered by SA and Transition testing. Should you have generated Path delay patterns by providing the Critical paths? 1. PI means Primary Inputs. scan IN, clock, scan enable are PIs. So it always come into _pi group. 2. (...)
etlibgenerator tool provided by tessent LV does not support LV scan model generation of clock gating cells. How to handle clock gating cells in LV flow? How to provide definition of clock gating cells in ETChecker step of LV flow?
scan disable means for me, the chip is in functional or test modes.
If your STA signoff is promising, maybe the error is caused by the asynchronous path if there are multiple scan clock. The other reason maybe the relationship between active edge of clock and probe point for measurement. It's better to check your simulated waveform for more details. If possible, I hope that you can share your result. Thanks.
Hi, I am using Synopsys DC/DFTC to insert scan at IP level. I have 2 clocks at the IP ports: CLK and TST_CLK. The PLL sits outside the IP and CLK is assumed to be PLL clock. TST_CLK is the shift clock. Both these clocks goes into a CKGEN block (kind of OCC in RTL) where one single internal (...)
High Fanout Nets: Some nets other than clock nets is called HFN. Ex: Reset, scan Enable etc. During synthesis, We set set_max_fanout to some number. i.e. we are telling the synthesis tool to that more than the max_fanout number treat it as High fanout net , so the tool knows and buffers the nets.